W. Zhiyuan and L. Lan, “Technology Circles, Technology Layers, and Technology Layer Profiles: A Three-Dimensional Study of Technological History: 技术圈、技术层与技术层剖面—技术史的立体化研究”, siss, vol. 42, no. 5, pp. 342–356, May 2024, doi: 10.65967/siss.v42i5.14.