YULAN, Chen; YUTONG, Liu; JIAN, Du. Research on the influence of Sino - US technology rivalry on patent litigation of Chinese firms in the US: 中美技术博弈对中国企业在美专利被诉的影响. Studies in Science of Science, [S. l.], v. 43, n. 10, p. 721–737, 2025. DOI: 10.65967/siss.v43i10.107. Disponível em: https://casscience.cn/siss/article/view/107. Acesso em: 26 mar. 2026.